Research Activities
Expertise in Gate Oxide Reliability Analysis
- High Temperature Gate Bias
- Bias Temperature Instability
- Impact of Preconditioning
Related Papers
- J. A. O. Gonz谩lez and O. Alatise, "," in IEEE Transactions on Power Electronics
- J. O. Gonzalez and O. Alatise, "," in IEEE Transactions on Industry Applications
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J. Ortiz Gonzalez and O. Alatise, "," in IEEE Transactions on Power Electronics
Expertise in Short Circuit Analysis
- Measurement of Short circuit withstand time in SiC MOSFETs and silicon IGBTs
- Finite element simulations of short circuit performance in Power Semiconductors
Related Papers
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E. Bashar et al., "" 2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA)
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R. Yu et al., "" in IEEE Transactions on Power Electronics
- R. Wu, S.N. Agbo, S. Mendy, E. Bashar, S. Jahdi, Ortiz Gonzalez, O. Alatise, , Microelectronics Reliability
Expertise in press-pack design and analysis
- Design and assembly of press-pack prototypes
- Power cycling and reliability assessment
Related Papers
- J. Ortiz Gonzalez et al., "," in IEEE Transactions on Industrial Electronics
- J. Ortiz Gonzalez, A.M. Aliyu, O. Alatise, A. Castellazzi, L. Ran, P. Mawby, , Microelectronics Reliability
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J. A. O. Gonzalez, O. Alatise, L. Ran, P. Mawby, P. Rajaguru and C. Bailey, ","2016 IEEE Energy Conversion Congress and Exposition (ECCE)
Unclamped Inductive Switching Analysis
- Measurement of Avalanche Ruggedness in Power Semiconductor Devices
- Finite Element Simulations of Devices under Avalanche Mode Conduction
- Benchmarking of SiC MOSFETs and Silicon IGBTs
Related Papers
- P. Alexakis, O. Alatise, J. Hu, S. Jahdi, L. Ran and P. A. Mawby, "" in IEEE Transactions on Electron Devices,
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J. Hu, O. Alatise, J. A. O. Gonz谩lez, R. Bonyadi, L. Ran and P. A. Mawby, "" in IEEE Transactions on Power Electronics
- J. Ortiz Gonzalez, A. Deb, E. Bashar, S.N. Agbo, S. Jahdi, O. Alatise, Microelectronics Reliability
Body Diode Switching Stability
- Analysis of body diode reverse recovery dynamics
- Body diode snappiness evaluation
Related Papers
- S. Jahdi et al., "" in IEEE Transactions on Power Electronics,
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R. Bonyadi et al., "" in IEEE Transactions on Power Electronics
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S. Jahdi, O. Alatise, L. Ran and P. Mawby, "," in IEEE Transactions on Industrial Electronics,
Gallium Nitride Research
- Bias Temperature Instability in GaN e-HEMTs
- Junction Temperature Sensing in GaN e-HEMTs
Related Papers
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B. Etoz, J. O. Gonzalez, A. Deb, S. Jahdi and O. Alatise, "I" 2022 24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe), Hanover, Germany, 2022, pp. P.1-P.9.
- J. Ortiz Gonzalez, M. Hedayati, S. Jahdi, B.H. Stark, O. Alatise, Microelectronics Reliability,
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J. O. Gonzalez, B. Etoz and O. Alatise, "," 2020 IEEE Energy Conversion Congress and Exposition (ECCE), Detroit, MI, USA, 2020, pp. 217-224